Cite
HARVARD Citation
Merhej, M. et al. (n.d.). Direct measurement of AC electrokinetics properties and capture frequencies of silicon and silicon–germanium nanowires. Semiconductor science and technology. p. . [Online].
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Merhej, M. et al. (n.d.). Direct measurement of AC electrokinetics properties and capture frequencies of silicon and silicon–germanium nanowires. Semiconductor science and technology. p. . [Online].