Cite
HARVARD Citation
Brixius, K. et al. (2018). Second-harmonic generation as a probe for structural and electronic properties of buried GaP/Si(0 0 1) interfaces. Journal of physics. p. . [Online].
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Brixius, K. et al. (2018). Second-harmonic generation as a probe for structural and electronic properties of buried GaP/Si(0 0 1) interfaces. Journal of physics. p. . [Online].