Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review. (10th July 2018)
- Record Type:
- Journal Article
- Title:
- Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review. (10th July 2018)
- Main Title:
- Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review
- Authors:
- Collins, Liam
Kilpatrick, Jason I
Kalinin, Sergei V
Rodriguez, Brian J - Abstract:
- Abstract: Fundamental mechanisms of energy storage, corrosion, sensing, and multiple biological functionalities are directly coupled to electrical processes and ionic dynamics at solid–liquid interfaces. In many cases, these processes are spatially inhomogeneous taking place at grain boundaries, step edges, point defects, ion channels, etc and possess complex time and voltage dependent dynamics. This necessitates time-resolved and real-space probing of these phenomena. In this review, we discuss the applications of force-sensitive voltage modulated scanning probe microscopy (SPM) for probing electrical phenomena at solid–liquid interfaces. We first describe the working principles behind electrostatic and Kelvin probe force microscopies (EFM & KPFM) at the gas–solid interface, review the state of the art in advanced KPFM methods and developments to (i) overcome limitations of classical KPFM, (ii) expand the information accessible from KPFM, and (iii) extend KPFM operation to liquid environments. We briefly discuss the theoretical framework of electrical double layer (EDL) forces and dynamics, the implications and breakdown of classical EDL models for highly charged interfaces or under high ion concentrations, and describe recent modifications of the classical EDL theory relevant for understanding nanoscale electrical measurements at the solid–liquid interface. We further review the latest achievements in mapping surface charge, dielectric constants, and electrodynamic andAbstract: Fundamental mechanisms of energy storage, corrosion, sensing, and multiple biological functionalities are directly coupled to electrical processes and ionic dynamics at solid–liquid interfaces. In many cases, these processes are spatially inhomogeneous taking place at grain boundaries, step edges, point defects, ion channels, etc and possess complex time and voltage dependent dynamics. This necessitates time-resolved and real-space probing of these phenomena. In this review, we discuss the applications of force-sensitive voltage modulated scanning probe microscopy (SPM) for probing electrical phenomena at solid–liquid interfaces. We first describe the working principles behind electrostatic and Kelvin probe force microscopies (EFM & KPFM) at the gas–solid interface, review the state of the art in advanced KPFM methods and developments to (i) overcome limitations of classical KPFM, (ii) expand the information accessible from KPFM, and (iii) extend KPFM operation to liquid environments. We briefly discuss the theoretical framework of electrical double layer (EDL) forces and dynamics, the implications and breakdown of classical EDL models for highly charged interfaces or under high ion concentrations, and describe recent modifications of the classical EDL theory relevant for understanding nanoscale electrical measurements at the solid–liquid interface. We further review the latest achievements in mapping surface charge, dielectric constants, and electrodynamic and electrochemical processes in liquids. Finally, we outline the key challenges and opportunities that exist in the field of nanoscale electrical measurements in liquid as well as providing a roadmap for the future development of liquid KPFM. … (more)
- Is Part Of:
- Reports on progress in physics. Volume 81:Number 8(2018:Aug.)
- Journal:
- Reports on progress in physics
- Issue:
- Volume 81:Number 8(2018:Aug.)
- Issue Display:
- Volume 81, Issue 8 (2018)
- Year:
- 2018
- Volume:
- 81
- Issue:
- 8
- Issue Sort Value:
- 2018-0081-0008-0000
- Page Start:
- Page End:
- Publication Date:
- 2018-07-10
- Subjects:
- Kelvin probe force microscopy -- scanning probe microscopy -- liquid KPFM -- solid liquid interface -- electrostatic force microscopy -- atomic force microscopy
Physics -- Periodicals
530.05 - Journal URLs:
- http://iopscience.iop.org/0034-4885 ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1361-6633/aab560 ↗
- Languages:
- English
- ISSNs:
- 0034-4885
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 11353.xml