Destructive electronics from electrochemical-mechanically triggered chemical dissolution. (8th May 2017)

• Record Type: Journal Article
• Authors: Sim, Kyoseung; Wang, Xu; Li, Yuhang; Linghu, Changhong; Gao, Yang; Song, Jizhou; Yu, Cunjiang
• Is Part Of: Journal of micromechanics and microengineering. Volume 27:Number 6(2017:Jun.)
• Publication Date: 2017-05-08
• Subjects: destructive electronics -- transient electronics -- electrochemical-mechanical -- dissolution; Microelectromechanical systems -- Periodicals; Micromechanics -- Periodicals; 621.38105
• DOI: 10.1088/1361-6439/aa682f
• Languages: English
• ISSNs: 0960-1317

Abstract

Abstract: The considerable need to enhance data and hardware security suggest one possible future for electronics where it is possible to destroy them and even make them disappear physically. This paper reports a type of destructive electronics which features fast transience from chemical dissolution on-demand triggered in an electrochemical-mechanical manner. The detailed materials, mechanics, and device construction of the destructive electronics are presented. Experiment and analysis of the triggered releasing and transience study of electronic materials, resistors and metal-oxide-semiconductor field effect transistors illustrate the key aspects of the destructive electronics. The reported destructive electronics is useful in a wide range of areas from security and defense, to medical applications