Comparative study of UV radiation hardness of n+p and p+n duo-lateral position sensitive detectors. Issue 2 (15th October 2014)

• Record Type: Journal Article
• Authors: Esebamen, Omeime Xerviar; Thungström, Göran; Nilsson, Hans-Erik; Lundgren, Anders
• Is Part Of: European physical journal. Number 68:Issue 2(2014:Nov.)
• Publication Date: 2014-10-15
• Subjects: Physics -- Periodicals; Microscopy -- Periodicals; Microchemistry -- Periodicals; Microstructure -- Periodicals; 530
• DOI: 10.1051/epjap/2014140253
• Languages: English
• ISSNs: 1286-0042

Abstract

Abstract : We report experimental results on the degree of radiation damage in two duo-lateral position sensitive detectors (LPSDs) exposed to 193 nm and 253 nm ultraviolet (UV) beam. One of the detectors was an in-house fabricated n + p LPSD and the other was a commercially available p + n LPSD. We report that at both wavelengths, the degradation damage from the UV photons absorption caused a much more significant deterioration in responsivity in the p + n LPSD than in the n + p LPSD. By employing a simple method, we were able to visualize the radiation damage on the active area of the LPSDs using 3-dimensional graphs. We were also able to characterize the impact of radiation damage on the linearity and position error of the detectors.