Cite
HARVARD Citation
Guo, S. et al. (2018). Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits. Microelectronics and reliability. pp. 101-111. [Online].
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Guo, S. et al. (2018). Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits. Microelectronics and reliability. pp. 101-111. [Online].