Cite
HARVARD Citation
Ding, L. et al. (2018). Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model. Microelectronics and reliability. pp. 337-341. [Online].
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Ding, L. et al. (2018). Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model. Microelectronics and reliability. pp. 337-341. [Online].