Cite
HARVARD Citation
Hsieh, C. et al. (2019). Nonlinear behavior analysis and control of the atomic force microscope and circuit implementation. Journal of low frequency noise, vibration, and active control. 38 (3), pp. 1576-1593. [Online].
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Hsieh, C. et al. (2019). Nonlinear behavior analysis and control of the atomic force microscope and circuit implementation. Journal of low frequency noise, vibration, and active control. 38 (3), pp. 1576-1593. [Online].