Cite
HARVARD Citation
Li, X. et al. (2018). Synergistic effects of NPN transistors caused by combined proton irradiations with different energies. Microelectronics and reliability. pp. 130-135. [Online].
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Li, X. et al. (2018). Synergistic effects of NPN transistors caused by combined proton irradiations with different energies. Microelectronics and reliability. pp. 130-135. [Online].