Electrical and optical properties of sub-10 nm nickel silicide films for silicon solar cells. (9th December 2016)

• Record Type: Journal Article
• Authors: Brahmi, Hatem; Ravipati, Srikanth; Yarali, Milad; Shervin, Shahab; Wang, Weijie; Ryou, Jae-Hyun; Mavrokefalos, Anastassios
• Is Part Of: Journal of physics. Volume 50:Number 3(2017)
• Publication Date: 2016-12-09
• Subjects: ultra-thin film -- nickel silicide -- transparent conductor -- reflectance -- Drude-model -- refractive index -- p-type conductor; Physics -- Periodicals; 530
• DOI: 10.1088/1361-6463/50/3/035102
• Languages: English
• ISSNs: 0022-3727

Abstract

Abstract: Highly conductive and transparent films of ultra-thin p-type nickel silicide films have been prepared by RF magnetron sputtering of nickel on silicon substrates followed by rapid thermal annealing in an inert environment in the temperature range 400–600 °C. The films are uniform throughout the wafer with thicknesses in the range of 3–6 nm. The electrical and optical properties are presented for nickel silicide films with varying thickness. The Drude–Lorentz model and Fresnel equations were used to calculate the dielectric properties, sheet resistance, absorption and transmission of the films. These ultrathin nickel silicide films have excellent optoelectronic properties for p-type contacts with optical transparencies up to 80% and sheet resistance as low as ~0.15 µΩ cm. Furthermore, it was shown that the use of a simple anti-reflection (AR) coating can recover most of the reflected light approaching the values of a standard Si solar cell with the same AR coating. Overall, the combination of ultra-low thickness, high transmittance, low sheet resistance and ability to recover the reflected light by utilizing standard AR coating makes them ideal for utilization in silicon based photovoltaic technologies as a p-type transparent conductor.