Cadmium zinc telluride pixel detectors for high-intensity x-ray imaging at free electron lasers. (24th December 2018)

• Record Type: Journal Article
• Authors: Veale, M C; Angelsen, C; Booker, P; Coughlan, J; French, M J; Hardie, A; Hart, M; Lipp, J; Nicholls, T; Schneider, A; Seller, P; Sole, D; Thomas, B; Wilson, M; Carini, G A; Hart, P; Nakahara, K; Sato, T; Hansson, C; Iniewski, K; Marthandam, P; Prekas, G
• Is Part Of: Journal of physics. Volume 52:Number 8(2019)
• Publication Date: 2018-12-24
• Subjects: x-ray detectors -- free electron lasers -- CdZnTe sensors -- ASIC -- x-ray imaging -- semiconductors; Physics -- Periodicals; 530
• DOI: 10.1088/1361-6463/aaf556
• Languages: English
• ISSNs: 0022-3727

Abstract

Abstract: This paper reports the first demonstration of high-intensity x-ray imaging using cadmium zinc telluride (CdZnTe) pixel detectors at a free electron laser (FEL). Prototype detectors were produced using the STFC large pixel detector (LPD) ASIC and sensors fabricated from a novel high-intensity-capable CdZnTe material produced by Redlen Technologies. Characterisation of the performance of this sensor material was completed at the Linac Coherent Light Source (LCLS) FEL. The detectors were operated at a frame rate of 1 MHz with 9.5 keV x-ray pulses delivered at a rate of 120 Hz. Measurements successfully demonstrated the linear response of the CdZnTe material to increasing numbers of x-rays up to a fluence of 8 GeV mm −2 per pulse, the limit of the dynamic range of the LPD ASIC.