Cite
HARVARD Citation
Ning, H. et al. (2018). A study of contact properties between molybdenum and amorphous silicon tin oxide thin film transistors. Journal of the Society for Information Display. 26 (12), pp. 681-686. [Online].
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Ning, H. et al. (2018). A study of contact properties between molybdenum and amorphous silicon tin oxide thin film transistors. Journal of the Society for Information Display. 26 (12), pp. 681-686. [Online].