A comparison of low-shock and centrifuge calibrations using piezoresistive accelerometers. (24th January 2018)

• Record Type: Journal Article
• Authors: Nozato, Hideaki; Shimizu, Masao; Nakao, Shinji; Chiba, Sakae; Ota, Akihiro; Kokuyama, Wataru; Hattori, Koichiro
• Is Part Of: Metrologia. Volume 55:Number 1(2018:Feb.)
• Page Start: S13
• Page End: S22
• Publication Date: 2018-01-24
• Subjects: calibration -- piezoresistive accelerometer -- ISO 16063-17 -- ISO 16063-13 -- ISO 6487 -- low-shock -- centrifuge; Weights and measures -- Periodicals; Weights and Measures -- Periodicals; 530.805
• DOI: 10.1088/1681-7575/aa8eaa
• Languages: English
• ISSNs: 0026-1394

Abstract

Abstract: This paper describes the degree of equivalence between low-shock and centrifuge calibrations up to 10 000 m s −2 against three types of piezoresistive accelerometer: an undamped sputter gauge type, a damped sputter gauge type and an undamped semiconductive type. The complex sensitivity in the low-shock calibration and the DC sensitivity in the centrifuge calibration are well consistent within each expanded uncertainty in the frequency domain, together with the vibration calibration using the second-order transfer function. In addition, the preliminary uncertainty budget in the centrifuge calibration facility is also indicated, and distinctly estimated from the viewpoint of the mechanical parts and accelerometers.