Determining the directional strain shift coefficients for tensile Ge: a combined x-ray diffraction and Raman spectroscopy study. (11th January 2017)

• Record Type: Journal Article
• Authors: Etzelstorfer, Tanja; Wyss, Andreas; Süess, Martin J; Schlich, Franziska F; Geiger, Richard; Frigerio, Jacopo; Stangl, Julian
• Is Part Of: Measurement science & technology. Volume 28:Number 2(2017:Feb.)
• Publication Date: 2017-01-11
• Subjects: local strain measurement -- tensile germanium -- Raman -- x-ray diffraction -- phonon deformation potentials; Physical measurements -- Periodicals; Scientific apparatus and instruments -- Periodicals; Equipment and Supplies -- Periodicals; Science -- instrumentation -- Periodicals; Technology -- instrumentation -- Periodicals; Mesures physiques -- Périodiques; Physical measurements; Scientific apparatus and instruments; Periodicals; 502.87
• DOI: 10.1088/1361-6501/aa5372
• Languages: English
• ISSNs: 0957-0233

Abstract

Abstract: In this work the calibration of the directional Raman strain shift coefficient for tensile strained Ge microstructures is reported. The strain shift coefficient is retrieved from micro-Raman spectroscopy measurements in combination with absolute strain measurements from x-ray diffraction using focused synchrotron radiation. The results are used to fit the phonon deformation potentials. A linear dependence of the phonon deformation potentials p and q is revealed. The method can be extended to provide strain calibration of Raman experiments also in other material system.