Characterization of the magnetic moments of ultrathin Fe film in an external electric field via high-precision X-ray magnetic circular dichroism spectroscopy. (12th May 2017)

• Record Type: Journal Article
• Authors: Tsukahara, Takuya; Kawabe, Takeshi; Shimose, Koki; Furuta, Taishi; Miyakaze, Risa; Nawaoka, Kohei; Goto, Minori; Nozaki, Takayuki; Yuasa, Shinji; Kotani, Yoshinori; Toyoki, Kentaro; Suzuki, Motohiro; Nakamura, Tetsuya; Suzuki, Yoshishige; Miwa, Shinji
• Is Part Of: Japanese journal of applied physics. Volume 56:Number 6(2017)
• Publication Date: 2017-05-12
• Subjects: Physics -- Periodicals; 621.05
• DOI: 10.7567/JJAP.56.060304
• Languages: English
• ISSNs: 0021-4922

Abstract

Abstract: The magnetic moments of a Pt|Fe(0.5 nm)|MgO film at an external electric field of in a 0.35 V/nm were characterized by analyzing the X-ray magnetic circular dichroism (XMCD) at the L-edges of Fe using a partial fluorescence yield method with a precision 40 times greater than that in our previous study. The XMCD induced by the electric field was negligible (<0.2%). Furthermore, although an induced orbital magnetic moment seemingly existed, it was within the precision error (0.3%). This paper demonstrates that slight electron doping and/or redistribution without any electrochemical reaction causes voltage-controlled magnetic anisotropy at Fe|MgO interfaces.