Cite
HARVARD Citation
Liu, S. et al. (2017). Effect of high-temperature/current stress on the forward tunneling current of InGaN/GaN high-power blue-light-emitting diodes. Japanese journal of applied physics. p. . [Online].
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Liu, S. et al. (2017). Effect of high-temperature/current stress on the forward tunneling current of InGaN/GaN high-power blue-light-emitting diodes. Japanese journal of applied physics. p. . [Online].