Characterization of ARDESIA: a 4-channel SDD X-ray spectrometer for synchrotron measurements at high count rates. (18th June 2019) - Hafizh, I.; Bellotti, G.; Carminati, M.; Utica, G.; Gugiatti, M.; Balerna, A.; Tullio, V.; Lepore, G.O.; Borghi, G.; Ficorella, F.; Picciotto, A.; Zorzi, N.; et al.