Permutation entropy and statistical complexity in characterising low-aspect-ratio reversed-field pinch plasma. (6th April 2017)

• Record Type: Journal Article
• Authors: Onchi, T; Fujisawa, A; Sanpei, A; Himura, H; Masamune, S
• Other Names: collab.
• Is Part Of: Physica scripta. Volume 92:Number 5(2017:May)
• Publication Date: 2017-04-06
• Subjects: permutation entropy -- statistical complexity -- reversed field pinch; Physics -- Periodicals; 530.05
• DOI: 10.1088/1402-4896/aa6689
• Languages: English
• ISSNs: 0031-8949

Abstract

Abstract: Permutation entropy and statistical complexity are measures for complex time series. The Bandt–Pompe methodology evaluates probability distribution using permutation. The method is robust and effective to quantify information of time series data. Statistical complexity is the product of Jensen–Shannon divergence and permutation entropy. These physical parameters are introduced to analyse time series of emission and magnetic fluctuations in low-aspect-ratio reversed-field pinch (RFP) plasma. The observed time-series data aggregates in a region of the plane, the so-called C – H plane, determined by entropy versus complexity. The C – H plane is a representation space used for distinguishing periodic, chaos, stochastic and noisy processes of time series data. The characteristics of the emissions and magnetic fluctuation change under different RFP-plasma conditions. The statistical complexities of soft x-ray emissions and magnetic fluctuations depend on the relationships between reversal and pinch parameters.