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HARVARD Citation
Xu, Y. et al. (n.d.). A fast iterative updated thresholding algorithm with sparsity constrains for electrical resistance tomography. Measurement science & technology. p. . [Online].
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Xu, Y. et al. (n.d.). A fast iterative updated thresholding algorithm with sparsity constrains for electrical resistance tomography. Measurement science & technology. p. . [Online].