Cite
HARVARD Citation
Xu, R. et al. (2018). Nanoscale charge transfer and diffusion at the MoS2/SiO2 interface by atomic force microscopy: contact injection versus triboelectrification. Nanotechnology. p. . [Online].
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Xu, R. et al. (2018). Nanoscale charge transfer and diffusion at the MoS2/SiO2 interface by atomic force microscopy: contact injection versus triboelectrification. Nanotechnology. p. . [Online].