Cite
HARVARD Citation
Liao, P. et al. (n.d.). Effect of mechanical-strain-induced defect generation on the performance of flexible amorphous In–Ga–Zn–O thin-film transistors. Applied physics express. p. . [Online].
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Liao, P. et al. (n.d.). Effect of mechanical-strain-induced defect generation on the performance of flexible amorphous In–Ga–Zn–O thin-film transistors. Applied physics express. p. . [Online].