High resolution subsurface imaging using resonance-enhanced detection in 2nd-harmonic KPFM. (30th July 2018)

• Record Type: Journal Article
• Authors: Cadena, Maria J; Reifenberger, Ronald G; Raman, Arvind
• Is Part Of: Nanotechnology. Volume 29:Number 40(2018)
• Publication Date: 2018-07-30
• Subjects: subsurface imaging -- 2nd-harmonic KPFM -- resonance-enhanced -- AFM; Nanotechnology -- Periodicals; Nanotechnology -- Periodicals; Nanotechnology; Publications périodiques; Nanotechnologies; Periodicals; 620.5
• DOI: 10.1088/1361-6528/aacfdc
• Languages: English
• ISSNs: 0957-4484

Abstract

Abstract: Second harmonic Kelvin probe force microscopy is a robust mechanism for subsurface imaging at the nanoscale. Here we exploit resonance-enhanced detection as a way to boost the subsurface contrast with higher force sensitivity using lower bias voltages, in comparison to the traditional off-resonance case. In this mode, the second harmonic signal of the electrostatic force is acquired at one of the eigenmode frequencies of the microcantilever. As a result, high resolution subsurface images are obtained in a variety of nanocomposites. To further understand the subsurface imaging detection upon electrostatic forces, we use a finite element model that approximates the geometry of the probe and sample. This allows the investigation of the contrast mechanism, the depth sensitivity and lateral resolution depending on tip-sample properties.