Cite
HARVARD Citation
Xiong, C. et al. (n.d.). Interfacial passivation of n-ZnO/p-Si heterojunction by CuI thin layer *Project supported by the "333 High-Level Talents Training Project" in Jiangsu Province of China (No. BRA2016111), the Qing Lan Project of Jiangsu Higher Education, the Science and Technology Program of Changzhou (No. CE20175031), the Jiangsu Province Key R & D Projects (No. BE2016200), and the High-Tech Key Laboratory of Changzhou (No. CM20173003).. Journal of semiconductors. p. . [Online].