Subpixel response of SOI pixel sensor for X-ray astronomy with pinned depleted diode: first result from mesh experiment. (5th June 2019)

• Record Type: Journal Article
• Authors: Kayama, K.; Tsuru, T. G.; Tanaka, T.; Uchida, H.; Harada, S.; Okuno, T.; Amano, Y.; Hiraga, J. S.; Yoshida, M.; Kamata, Y.; Sakuma, S.; Yuhi, D.; Urabe, Y.; Tsunemi, H.; Matsumura, H.; Kawahito, S.; Kagawa, K.; Yasutomi, K.; Shrestha, S.; Nakanishi, S.; Kamehama, H.; Arai, Y.; Kurachi, I.; Takeda, A.; Mori, K.; Nishioka, Y.; Fukuda, K.; Hida, T.; Yukumoto, M.; Kohmura, T.; Hagino, K.; Oono, K.; Negishi, K.; Yarita, K.;
• Is Part Of: Journal of instrumentation. Volume 14:Number 6(2019)
• Page Start: C06005
• Page End: C06005
• Publication Date: 2019-06-05
• Subjects: Scientific apparatus and instruments -- Periodicals; 502.84
• DOI: 10.1088/1748-0221/14/06/C06005
• Languages: English
• ISSNs: 1748-0221