Cite
HARVARD Citation
Kim, K. et al. (2018). Direct observation of leakage currents in a metal–insulator–metal capacitor using in situ transmission electron microscopy. Nanotechnology. p. . [Online].
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Kim, K. et al. (2018). Direct observation of leakage currents in a metal–insulator–metal capacitor using in situ transmission electron microscopy. Nanotechnology. p. . [Online].