Cite
HARVARD Citation
Han, D. et al. (2017). Analysis of carrier recombination dynamics in InGaN-based light-emitting diodes by differential carrier lifetime measurement. Applied physics express. p. . [Online].
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Han, D. et al. (2017). Analysis of carrier recombination dynamics in InGaN-based light-emitting diodes by differential carrier lifetime measurement. Applied physics express. p. . [Online].