Cite
HARVARD Citation
Sznajder, M. et al. (2017). Comparative ab initio studies on morphology and stability of the C/BN and SiC/GaN heterostructure interfaces. Materials research express. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Sznajder, M. et al. (2017). Comparative ab initio studies on morphology and stability of the C/BN and SiC/GaN heterostructure interfaces. Materials research express. p. . [Online].