Test beam measurement of ams H35 HV-CMOS capacitively coupled pixel sensor prototypes with high-resistivity substrate. (4th December 2018)

• Record Type: Journal Article
• Authors: Benoit, M.; Braccini, S.; Casanova, R.; Cavallaro, E.; Chen, H.; Chen, K.; Bello, F.A. Di; Ferrere, D.; Frizzell, D.; Golling, T.; Gonzalez-Sevilla, S.; Grinstein, S.; Iacobucci, G.; Kiehn, M.; Lanni, F.; Liu, H.; Metcalfe, J.; Meng, L.; Merlassino, C.; Miucci, A.; Muenstermann, D.; Nessi, M.; Okawa, H.; Perić, I.; Rimoldi, M.; Ristić, B.; Sultan, D.M.S.; Terzo, S.; Pinto, M. Vicente Barrero; Figueras, E. Vilella; Weber, M.; Weston, T.; Wu, W.; Xie, J.; Xu, L.; Zaffaroni, E.; Zhang, M.;
• Is Part Of: Journal of instrumentation. Volume 13:Number 12(2018:Dec.)
• Page Start: P12009
• Page End: P12009
• Publication Date: 2018-12-04
• Subjects: Analogue electronic circuits -- Electronic detector readout concepts (solid-state) -- Front-end electronics for detector readout -- VLSI circuits; Scientific apparatus and instruments -- Periodicals; 502.84
• DOI: 10.1088/1748-0221/13/12/P12009
• Languages: English
• ISSNs: 1748-0221