Low temperature dielectric relaxation in ordinary perovskite ferroelectrics: enlightenment from high-energy x-ray diffraction. (26th April 2017)

• Record Type: Journal Article
• Authors: Ochoa, D A; Levit, R; Fancher, C M; Esteves, G; Jones, J L; García, J E
• Is Part Of: Journal of physics. Volume 50:Number 20(2017)
• Publication Date: 2017-04-26
• Subjects: piezoelectric materials -- dielectric response -- dielectric relaxation -- ferroelectrics; Physics -- Periodicals; 530
• DOI: 10.1088/1361-6463/aa6b9e
• Languages: English
• ISSNs: 0022-3727

Abstract

Abstract: Ordinary ferroelectrics exhibit a second order phase transition that is characterized by a sharp peak in the dielectric permittivity at a frequency-independent temperature. Furthermore, these materials show a low temperature dielectric relaxation that appears to be a common behavior of perovskite systems. Tetragonal lead zirconate titanate is used here as a model system in order to explore the origin of such an anomaly, since there is no consensus about the physical phenomenon involved in it. Crystallographic and domain structure studies are performed from temperature dependent synchrotron x-ray diffraction measurement. Results indicate that the dielectric relaxation cannot be associated with crystallographic or domain configuration changes. The relaxation process is then parameterized by using the Vogel–Fulcher–Tammann phenomenological equation. Results allow us to hypothesize that the observed phenomenon is due to changes in the dynamic behavior of the ferroelectric domains related to the fluctuation of the local polarization.