Addressing Raman features of individual layers in isotopically labeled Bernal stacked bilayer graphene. (11th May 2016)

• Record Type: Journal Article
• Authors: Costa, Sara D; Weis, Johan Ek; Frank, Otakar; Fridrichová, Michaela; Kalbac, Martin
• Is Part Of: 2D materials. Volume 3:Number 2(2016)
• Publication Date: 2016-05-11
• Subjects: graphene bilayer -- Raman spectroscopy -- isotope labeling; Graphene -- Periodicals; Materials science -- Periodicals; Nanostructured materials -- Periodicals; 620.115
• DOI: 10.1088/2053-1583/3/2/025022
• Languages: English
• ISSNs: 2053-1583

Abstract

Abstract: In this report important Raman modes for the evaluation of strain in graphene (the 2D and 2D′) are analyzed. The isotope labeling is used to disentangle contribution of individual graphene layers of graphene bilayer to the studied Raman modes. It is shown that for Bernal-stacked bilayers, the 2D and the 2D′ Raman modes have three distinct components that can be assigned to processes originating solely from the top graphene layer, bottom graphene layer, and from a combination of processes originating both from the top and bottom layers. The reported results thus enable addressing the properties of individual graphene layers in graphene bilayer by Raman spectroscopy.