Sharpness-induced energy shifts of quantum well states in Pb islands on Cu(111). (30th January 2017)

• Record Type: Journal Article
• Authors: Chan, Wen-Yuan; Lu, Shin-Ming; Su, Wei-Bin; Liao, Chun-Chieh; Hoffmann, Germar; Tsai, Tsong-Ru; Chang, Chia-Seng
• Is Part Of: Nanotechnology. Volume 28:Number 9(2017)
• Publication Date: 2017-01-30
• Subjects: scanning tunneling microscopy -- tip sharpness -- quantum well states -- electric field inhomogeneity -- expansion deformation; Nanotechnology -- Periodicals; Nanotechnology -- Periodicals; Nanotechnology; Publications périodiques; Nanotechnologies; Periodicals; 620.5
• DOI: 10.1088/1361-6528/aa583a
• Languages: English
• ISSNs: 0957-4484

Abstract

Abstract: We elucidate that the tip sharpness in scanning tunneling microscopy (STM) can be characterized through the number of field-emission (FE) resonances. A higher number of FE resonances indicates higher sharpness. We observe empty quantum well (QW) states in Pb islands on Cu(111) under different tip sharpness levels. We found that QW states observed by sharper tips always had lower energies, revealing negative energy shifts. This sharpness-induced energy shift originates from an inhomogeneous electric field in the STM gap. An increase in sharpness increases the electric field inhomogeneity, that is, enhances the electric field near the tip apex, but weakens the electric field near the sample. As a result, higher sharpness can increase the electronic phase in vacuum, causing the lowering of QW state energies. Moreover, the behaviors of negative energy shift as a function of state energy are entirely different for Pb islands with a thickness of two and nine atomic layers. This thickness-dependent behavior results from the electrostatic force in the STM gap decreasing with increasing tip sharpness. The variation of the phase contributed from the expansion deformation induced by the electrostatic force in a nine-layer Pb island is significantly greater, sufficient to effectively negate the increase of electronic phase in vacuum.