Silicon Carbide membranes as substrate for Synchrotron measurements. (22nd May 2018)

Record Type:: Journal Article
Title:: Silicon Carbide membranes as substrate for Synchrotron measurements. (22nd May 2018)
Main Title:: Silicon Carbide membranes as substrate for Synchrotron measurements
Authors:: Altissimo, M.
Iacopi, A.
Hold, L.
Matruglio, A.
Zucchiatti, P.
Vaccari, L.
Bedolla, D.E.
Severino, L. Ulloa
Parisse, P.
Gianoncelli, A.
Abstract:
Is Part Of:: Journal of instrumentation. Volume 13:Number 5(2018:May)
Journal:: Journal of instrumentation
Issue:: Volume 13:Number 5(2018:May)
Issue Display:: Volume 13, Issue 5 (2018)
Year:: 2018
Volume:: 13
Issue:: 5
Issue Sort Value:: 2018-0013-0005-0000
Page Start:: C05017
Page End:: C05017
Publication Date:: 2018-05-22
Subjects:: Radiation and optical windows -- Manufacturing
Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/13/05/C05017 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 11081.xml