On determination of charge transfer efficiency of thick, fully depleted CCDs with 55Fe x-rays. (14th July 2017) - Yates, D.
Abstract: Charge transfer efficiency (CTE) is one of the most important CCD characteristics. This paper examines ways to optimize the algorithms used to analyze 55 Fe x-ray data on the CCDs, as well as explores new types of observables for CTE determination that can be used for testing LSST CCDs. The observables are modeled employing simple Monte Carlo simulations to determine how the charge diffusion in thick, fully depleted silicon affects the measurement. The data is compared to the simulations for one of the observables, integral flux of the x-ray hit.