Cite
HARVARD Citation
Singh, D. et al. (2017). High resolution x-ray diffraction study of the substrate temperature and thickness dependent microstructure of reactively sputtered epitaxial ZnO films. Materials research express. p. . [Online].
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Singh, D. et al. (2017). High resolution x-ray diffraction study of the substrate temperature and thickness dependent microstructure of reactively sputtered epitaxial ZnO films. Materials research express. p. . [Online].