Beam tests of silicon pixel 3D-sensors developed at SINTEF. (24th August 2018)
- Record Type:
- Journal Article
- Title:
- Beam tests of silicon pixel 3D-sensors developed at SINTEF. (24th August 2018)
- Main Title:
- Beam tests of silicon pixel 3D-sensors developed at SINTEF
- Authors:
- Dorholt, O.
Hansen, T.E.
Heggelund, A.
Kok, A.
Pacifico, N.
Rohne, O.
Sandaker, H.
Stugu, B.
Yang, Z.
Bomben, M.
Rummler, A.
Weingarten, J. - Abstract:
- Is Part Of:
- Journal of instrumentation. Volume 13:Number 8(2018:Aug.)
- Journal:
- Journal of instrumentation
- Issue:
- Volume 13:Number 8(2018:Aug.)
- Issue Display:
- Volume 13, Issue 8 (2018)
- Year:
- 2018
- Volume:
- 13
- Issue:
- 8
- Issue Sort Value:
- 2018-0013-0008-0000
- Page Start:
- P08020
- Page End:
- P08020
- Publication Date:
- 2018-08-24
- Subjects:
- Radiation-hard detectors -- Si microstrip and pad detectors
Scientific apparatus and instruments -- Periodicals
502.84 - Journal URLs:
- http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1748-0221/13/08/P08020 ↗
- Languages:
- English
- ISSNs:
- 1748-0221
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 11072.xml