Single Event Effects mitigation with TMRG tool. (26th January 2017)
- Record Type:
- Journal Article
- Title:
- Single Event Effects mitigation with TMRG tool. (26th January 2017)
- Main Title:
- Single Event Effects mitigation with TMRG tool
- Authors:
- Kulis, S.
- Abstract:
- Abstract: Single Event Effects (SEE) are a major concern for integrated circuits exposed to radiation. There have been several techniques proposed to protect circuits against radiation-induced upsets. Among the others, the Triple Modular Redundancy (TMR) technique is one of the most popular. The purpose of the Triple Modular Redundancy Generator (TMRG) tool is to automatize the process of triplicating digital circuits freeing the designer from introducing the TMR code manually at the implementation stage. It helps to ensure that triplicated logic is maintained through the design process. Finally, the tool streamlines the process of introducing SEE in gate level simulations for final verification.
- Is Part Of:
- Journal of instrumentation. Volume 12:Number 1(2017:Jan.)
- Journal:
- Journal of instrumentation
- Issue:
- Volume 12:Number 1(2017:Jan.)
- Issue Display:
- Volume 12, Issue 1 (2017)
- Year:
- 2017
- Volume:
- 12
- Issue:
- 1
- Issue Sort Value:
- 2017-0012-0001-0000
- Page Start:
- C01082
- Page End:
- C01082
- Publication Date:
- 2017-01-26
- Subjects:
- Digital electronic circuits -- Front-end electronics for detector readout -- Radiation-hard electronics -- VLSI circuits
Scientific apparatus and instruments -- Periodicals
502.84 - Journal URLs:
- http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1748-0221/12/01/C01082 ↗
- Languages:
- English
- ISSNs:
- 1748-0221
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 11069.xml