Atomic oxygen effects on polymers containing silicon or phosphorus: Mass loss, erosion yield, and surface morphology. (October 2019)

• Record Type: Journal Article
• Authors: Chunbo, Wang; Haifu, Jiang; Dongbo, Tian; Wei, Qin; Chunhai, Chen; Xiaogang, Zhao; Hongwei, Zhou; Daming, Wang
• Is Part Of: High performance polymers. Volume 31:Number 8(2019)
• Page Start: 969
• Page End: 976
• Publication Date: 2019-10
• Subjects: Atomic oxygen effects -- mass loss -- erosion yield -- surface morphology; Polymerization -- Periodicals; Polymers -- Periodicals; 547.7
• DOI: 10.1177/0954008318814150
• Languages: English
• ISSNs: 0954-0083

Abstract

The differences among polymers containing silicon or phosphorus, 20% polyhedral oligomeric silsesquioxane polyimide (20%-POSS-PI), 30% polysiloxane- block -polyimides (30%-PSX-PI), poly(siloxane imide) homopolymer (PSX-PI), and arylene ether phosphine oxide homopolymer (P-PPO), on mass loss, erosion yield, and surface morphology were elucidated. The tolerance against atomic oxygen (AO) was improved versus Kapton ® H after introducing silicon or phosphorus to the polymers. The relative order of the mass loss was PSX-PI < P-PPO < 20%-POSS-PI < 30%-PSX-PI. In contrast, the erosion yields of 30%-PSX-PI, 20%-POSS-PI, and P-PPO decreased by orders of magnitude (PSX-PI declined by about two orders). The surface of Kapton ® H was seriously eroded by AO exhibiting a "carpet-like" shape, and the roughness of the surface of Kapton ® H became remarkable as the AO fluence increased. PSX-PI, P-PPO, 20%-POSS-PI, and 30%-PSX-PI at an AO fluence of 5.2 × 10 20 atoms/cm 2 had different surface morphologies, and the relative order of the surface roughness was PSX-PI < 30%-PSX-PI < 20%-POSS-PI < P-PPO. The 30%-PSX-PI and PSX-PI had minor mass losses and a smooth surface. This kind of material might replace inorganic coatings for applications in low earth orbit.