An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography. (6th February 2019)

• Record Type: Journal Article
• Authors: Peng, Zirong; Lu, Yifeng; Hatzoglou, Constantinos; Kwiatkowski da Silva, Alisson; Vurpillot, Francois; Ponge, Dirk; Raabe, Dierk; Gault, Baptiste
• Editors: Thuvander, Mattias; Meisenkothen, Frederick; Sha, Gang
• Is Part Of: Microscopy and microanalysis. Volume 25:Number 2(2019)
• Page Start: 389
• Page End: 400
• Publication Date: 2019-02-06
• Subjects: atom probe tomography, -- data mining, -- Gibbsian interfacial excess, -- grain boundary, -- segregation; Microscopy -- Periodicals; Microchemistry -- Periodicals; 502.82
• DOI: 10.1017/S1431927618016112
• Languages: English
• ISSNs: 1431-9276

Abstract

Abstract: We introduce an efficient, automated computational approach for analyzing interfaces within atom probe tomography datasets, enabling quantitative mapping of their thickness, composition, as well as the Gibbsian interfacial excess of each solute. Detailed evaluation of an experimental dataset indicates that compared with the composition map, the interfacial excess map is more robust and exhibits a relatively higher resolution to reveal compositional variations. By field evaporation simulations with a predefined emitter mimicking the experimental dataset, the impact of trajectory aberrations on the measurement of the thickness, composition, and interfacial excess of the decorated interface are systematically analyzed and discussed.