Calibration of Atom Probe Tomography Reconstructions Through Correlation with Electron Micrographs. (4th February 2019)

• Record Type: Journal Article
• Authors: Mouton, Isabelle; Katnagallu, Shyam; Makineni, Surendra Kumar; Cojocaru-Mirédin, Oana; Schwarz, Torsten; Stephenson, Leigh Thomas; Raabe, Dierk; Gault, Baptiste
• Editors: Thuvander, Mattias; Meisenkothen, Frederick; Sha, Gang
• Is Part Of: Microscopy and microanalysis. Volume 25:Number 2(2019)
• Page Start: 301
• Page End: 308
• Publication Date: 2019-02-04
• Subjects: atom probe tomography, -- correlation, -- electron microscopy, -- reconstruction algorithm; Microscopy -- Periodicals; Microchemistry -- Periodicals; 502.82
• DOI: 10.1017/S1431927618016161
• Languages: English
• ISSNs: 1431-9276

Abstract

Abstract: Although atom probe tomography (APT) reconstructions do not directly influence the local elemental analysis, any structural inferences from APT volumes demand a reliable reconstruction of the point cloud. Accurate estimation of the reconstruction parameters is crucial to obtain reliable spatial scaling. In the current work, a new automated approach of calibrating atom probe reconstructions is developed using only one correlative projection electron microscopy (EM) image. We employed an algorithm that implements a 2D cross-correlation of microstructural features observed in both the APT reconstructions and the corresponding EM image. We apply this protocol to calibrate reconstructions in a Cu(In, Ga)Se2 -based semiconductor and in a Co-based superalloy. This work enables us to couple chemical precision to structural information with relative ease.