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HARVARD Citation
Wood, A. et al. (2017). Annealing-induced precipitate formation behavior in MOVPE-grown GaAs1−xBix explored by atom probe tomography and HAADF-STEM. Nanotechnology. p. . [Online].
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Wood, A. et al. (2017). Annealing-induced precipitate formation behavior in MOVPE-grown GaAs1−xBix explored by atom probe tomography and HAADF-STEM. Nanotechnology. p. . [Online].