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HARVARD Citation
Kim, J. et al. (2018). Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM. Microelectronics and reliability. pp. 183-185. [Online].
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Kim, J. et al. (2018). Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM. Microelectronics and reliability. pp. 183-185. [Online].