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HARVARD Citation
Reggiani, S. et al. (2018). TCAD investigation on hot-electron injection in new-generation technologies. Microelectronics and reliability. pp. 1090-1093. [Online].
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Reggiani, S. et al. (2018). TCAD investigation on hot-electron injection in new-generation technologies. Microelectronics and reliability. pp. 1090-1093. [Online].