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HARVARD Citation
Beyreuther, A. et al. (2018). Photon emission as a characterization tool for bipolar parasitics in FinFET technology. Microelectronics and reliability. pp. 273-276. [Online].
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Beyreuther, A. et al. (2018). Photon emission as a characterization tool for bipolar parasitics in FinFET technology. Microelectronics and reliability. pp. 273-276. [Online].