Cite
HARVARD Citation
Zhang, T. et al. (2019). Contributing to the understanding of the dielectric breakdown channel of alumina under high voltage. Ceramics international. 45 (13), pp. 16608-16611. [Online].
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Zhang, T. et al. (2019). Contributing to the understanding of the dielectric breakdown channel of alumina under high voltage. Ceramics international. 45 (13), pp. 16608-16611. [Online].