Cite
HARVARD Citation
Hao, S. et al. (2019). Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors. Reliability engineering & system safety. pp. 261-270. [Online].
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Hao, S. et al. (2019). Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors. Reliability engineering & system safety. pp. 261-270. [Online].