Aqueous solution-processed, self-flattening AlOx:Y dielectrics for fully-transparent thin-film transistors. Issue 13 (September 2019)
- Record Type:
- Journal Article
- Title:
- Aqueous solution-processed, self-flattening AlOx:Y dielectrics for fully-transparent thin-film transistors. Issue 13 (September 2019)
- Main Title:
- Aqueous solution-processed, self-flattening AlOx:Y dielectrics for fully-transparent thin-film transistors
- Authors:
- Wu, Weihua
Liang, Lingyan
Yu, Jingjing
Xiao, Xi
Zhang, Hongliang
Gao, Junhua
Zhuge, Fei
Chang, Ting-Chang
Lan, Linfeng
Cao, Hongtao - Abstract:
- Abstract: Dielectrics fabrication on rough substrates, always leading to microstructural defects and detrimental dielectric properties eventually, is a great challenge for academic endeavors in this field. We report here on self-flattening AlO x :Y dielectric thin films processed by a facile aqueous solution method. The obtained AlO x :Y dielectrics are dense, large-area uniform, and amenable to accurate control of film thickness by repeating the deposition cycles. In particular, an atomically smooth surface with a RMS of 0.10 nm was realized for the AlO x :Y film with a thickness of 14.5 nm on Si wafer, yielding a low leakage current density of 7.9 × 10 -8 A cm -2 @2 MV/cm, a dielectric constant of 8.8 @100 Hz, and an attenuated dielectric dispersion property. The interactions between pre-baked YO x underlayer and later-dropped AlO x precursor were comprehensively investigated, in order to understand the film growth mechanism and the origin of self-flattening effect. Fortunately, this self-flattening effect is also applicable to other substrates. A RMS of 0.81 nm was achieved on ITO glasses, and the height distribution profile of the film surface was found to follow symmetric Gaussian distribution. This preparation routine was also examined by device verification in the fully-transparent thin-film transistors. The combination of ease of preparation and attractive physical properties would provide a green-route solution platform for dielectric synthesis, for interfaceAbstract: Dielectrics fabrication on rough substrates, always leading to microstructural defects and detrimental dielectric properties eventually, is a great challenge for academic endeavors in this field. We report here on self-flattening AlO x :Y dielectric thin films processed by a facile aqueous solution method. The obtained AlO x :Y dielectrics are dense, large-area uniform, and amenable to accurate control of film thickness by repeating the deposition cycles. In particular, an atomically smooth surface with a RMS of 0.10 nm was realized for the AlO x :Y film with a thickness of 14.5 nm on Si wafer, yielding a low leakage current density of 7.9 × 10 -8 A cm -2 @2 MV/cm, a dielectric constant of 8.8 @100 Hz, and an attenuated dielectric dispersion property. The interactions between pre-baked YO x underlayer and later-dropped AlO x precursor were comprehensively investigated, in order to understand the film growth mechanism and the origin of self-flattening effect. Fortunately, this self-flattening effect is also applicable to other substrates. A RMS of 0.81 nm was achieved on ITO glasses, and the height distribution profile of the film surface was found to follow symmetric Gaussian distribution. This preparation routine was also examined by device verification in the fully-transparent thin-film transistors. The combination of ease of preparation and attractive physical properties would provide a green-route solution platform for dielectric synthesis, for interface engineering, and for well-performed devices on rough substrates. … (more)
- Is Part Of:
- Ceramics international. Volume 45:Issue 13(2019)
- Journal:
- Ceramics international
- Issue:
- Volume 45:Issue 13(2019)
- Issue Display:
- Volume 45, Issue 13 (2019)
- Year:
- 2019
- Volume:
- 45
- Issue:
- 13
- Issue Sort Value:
- 2019-0045-0013-0000
- Page Start:
- 15883
- Page End:
- 15891
- Publication Date:
- 2019-09
- Subjects:
- Thin-film transistor -- Oxide -- High-k dielectrics -- Solution -- Super hydrophilicity
Ceramics -- Periodicals
Céramique industrielle -- Périodiques
Ceramics
Periodicals
Electronic journals
666 - Journal URLs:
- http://www.sciencedirect.com/science/journal/02728842 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.ceramint.2019.05.093 ↗
- Languages:
- English
- ISSNs:
- 0272-8842
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 3119.015000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 10923.xml