Characterization of Nanocrystalline Yttria-Stabilized Zirconia: An In Situ HTXRD Study. (15th May 2011)

• Record Type: Journal Article
• Authors: Biswas, Mridula; Kumbhar, Chandrashekhar S.; Gowtam, D. S.
• Other Names: Käll P. O. Academic Editor.; Škorvánek Ivan Academic Editor.; Valtchev V. Academic Editor.
• Is Part Of: ISRN nanotechnology. Volume 2011(2011)
• Publication Date: 2011-05-15
• Subjects: Nanotechnology -- Periodicals; Nanotechnology; Nanotechnology; Electronic journals; Periodicals; Electronic journals; 620.5
• DOI: 10.5402/2011/305687
• Languages: English
• ISSNs: 2090-6064

Abstract

Abstract : Nanocrystalline yttria-stabilized zirconia powders, synthesized by the citrate nitrate gel combustion route, with yttria concentration varying from 8 to 12 mol% were studied by in situ high temperature X-ray diffraction in the temperature range of 25–1000°C. The sample obtained has a high specific surface area of 35 m 2 /g while calculated surface area was around 123 m 2 /g. The in situ high temperature X-ray diffraction study revealed that crystallite size remains in the range of 7–9 nm up to 800°C and then rapidly grows up to 21–23 nm upto 1000°C; only holding the material at 1000°C for 30 minutes can promote grain growth in the range of 42–49 nm. Coefficient of thermal expansion ranges from 9.65 to 9.03 ppm/°C for 8–12 mol% nanocrystalline yttria-stabilized zirconia.