Cite
HARVARD Citation
Pérez, E. et al. (2019). Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices. Solid-state electronics. pp. 51-56. [Online].
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Pérez, E. et al. (2019). Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices. Solid-state electronics. pp. 51-56. [Online].