Optimum Time-Censored Constant-Stress PALTSP for the Burr Type XII Distribution Using Tampered Failure Rate Model. (18th June 2014)

• Record Type: Journal Article
• Authors: Srivastava, P. W.; Sharma, D.
• Other Names: Sheu Shey-Huei Academic Editor.
• Is Part Of: Journal of quality and reliability engineering. Volume 2014(2014)
• Publication Date: 2014-06-18
• Subjects: Reliability (Engineering) -- Periodicals; Engineering -- Quality control -- Periodicals; Failure analysis (Engineering) -- Periodicals; Engineering -- Quality control; Failure analysis (Engineering); Reliability (Engineering); Electronic journals; Periodicals; 620.0045
• DOI: 10.1155/2014/564049
• Languages: English
• ISSNs: 2314-8055

Abstract

Abstract : This paper presents optimum design of time-censored constant-stress partially accelerated life test sampling plan (PALTSP) in which each item runs either at use or at accelerated conditions and product life follows Burr type XII. The optimal plan consists in finding out sample proportions allocated to both use and accelerated conditions by minimizing the asymptotic variance of test statistic for deciding on acceptance/rejection of the lot such that producer's and consumer's interests are safeguarded. The method developed has been illustrated using an example. Sensitivity analysis has also been carried out.