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HARVARD Citation
Mu, X. et al. (n.d.). Enhanced electrical properties of stoichiometric Bi0.5Sb1.5Te3 film with high-crystallinity via layer-by-layer in-situ Growth. Nano energy. pp. 55-64. [Online].
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Mu, X. et al. (n.d.). Enhanced electrical properties of stoichiometric Bi0.5Sb1.5Te3 film with high-crystallinity via layer-by-layer in-situ Growth. Nano energy. pp. 55-64. [Online].